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Proceedings Paper

Stacked, filtered multi-channel X-ray diode array
Author(s): L. P. MacNeil; E. C. Dutra; S. M. Compton; B. A. Jacoby; M. L. Raphaelian
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Paper Abstract

There are many types of X-ray diodes that are used for X-ray flux or spectroscopic measurements and for estimating the spectral shape of the VUV to soft X-ray spectrum. However, a need arose for a low cost, robust X-ray diode to use for experiments in hostile environments on multiple platforms, and for experiments that utilize forces that may destroy the diode(s). Since the typical proposed use required a small size with a minimal single line-of-sight, a parallel array could not be used. So, a stacked, filtered multi-channel X-ray diode array was developed, called the MiniXRD. To achieve significant cost savings while maintaining robustness and ease of field setup, repair, and replacement, we designed the system to be modular. The filters were manufactured in-house and cover the range from 450 eV to 5000 eV. To achieve the line-of-sight accuracy needed, we developed mounts and laser alignment techniques. We modeled and tested elements of the diode design at NSTec Livermore Operations (NSTec / LO) to determine temporal response and dynamic range, leading to diode shape and circuitry changes to optimize impedance and charge storage. We fielded individual and stacked systems at several national facilities as ancillary ‘ride-along’ diagnostics to test and improve the design usability. We present the MiniXRD system performance which supports consideration as a viable low-cost alternative for multiple-channel low-energy X-ray measurements. This diode array is currently at Technical Readiness Level (TRL) 6.

Paper Details

Date Published: 27 August 2015
PDF: 15 pages
Proc. SPIE 9595, Radiation Detectors: Systems and Applications XVI, 95950N (27 August 2015); doi: 10.1117/12.2189117
Show Author Affiliations
L. P. MacNeil, National Security Technologies, LLC (United States)
E. C. Dutra, National Security Technologies, LLC (United States)
S. M. Compton, Lawrence Livermore National Lab. (United States)
B. A. Jacoby, Lawrence Livermore National Lab. (United States)
M. L. Raphaelian, National Security Technologies, LLC (United States)


Published in SPIE Proceedings Vol. 9595:
Radiation Detectors: Systems and Applications XVI
Gary P. Grim; H. Bradford Barber, Editor(s)

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