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Proceedings Paper

A modeling framework for potential induced degradation in PV modules
Author(s): Peter Bermel; Reza Asadpour; Chao Zhou; Muhammad Ashraful Alam
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Paper Abstract

Major sources of performance degradation and failure in glass-encapsulated PV modules include moisture-induced gridline corrosion, potential-induced degradation (PID) of the cell, and stress-induced busbar delamination. Recent studies have shown that PV modules operating in damp heat at -600 V are vulnerable to large amounts of degradation, potentially up to 90% of the original power output within 200 hours. To improve module reliability and restore power production in the presence of PID and other failure mechanisms, a fundamental rethinking of accelerated testing is needed. This in turn will require an improved understanding of technology choices made early in development that impact failures later.

In this work, we present an integrated approach of modeling, characterization, and validation to address these problems. A hierarchical modeling framework will allows us to clarify the mechanisms of corrosion, PID, and delamination. We will employ a physics-based compact model of the cell, topology of the electrode interconnection, geometry of the packaging stack, and environmental operating conditions to predict the current, voltage, temperature, and stress distributions in PV modules correlated with the acceleration of specific degradation modes. A self-consistent solution will capture the essential complexity of the technology-specific acceleration of PID and other degradation mechanisms as a function of illumination, ambient temperature, and relative humidity. Initial results from our model include specific lifetime predictions suitable for direct comparison with indoor and outdoor experiments, which are qualitatively validated by prior work. This approach could play a significant role in developing novel accelerated lifetime tests.

Paper Details

Date Published: 23 September 2015
PDF: 8 pages
Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 95630C (23 September 2015); doi: 10.1117/12.2188813
Show Author Affiliations
Peter Bermel, Purdue Univ. (United States)
Reza Asadpour, Purdue Univ. (United States)
Chao Zhou, Purdue Univ. (United States)
Muhammad Ashraful Alam, Purdue Univ. (United States)


Published in SPIE Proceedings Vol. 9563:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII
Neelkanth G. Dhere; John H. Wohlgemuth; Rebecca Jones-Albertus, Editor(s)

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