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Proceedings Paper

Development of a soft x-ray ptychography beamline at SSRL and its application in the study of energy storage materials
Author(s): Anna M. Wise; Hendrik Ohldag; William Chueh; Joshua Turner; Michael F. Toney; Johanna Nelson Weker
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Paper Abstract

Ptychography is an emerging high resolution coherent imaging technique which can improve the resolution of current scanning transmission X-ray microscopy systems by over ten-fold. Development of this capability is underway at Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, to establish sub-5 nm resolution ptychographic imaging with spatially resolved near-edge X-ray absorption fine structure spectroscopy. This is being achieved via an upgrade of the current soft X-ray scanning transmission X-ray microscope at beamline 13-1, involving the installation of an area detector and an interferometer system for high precision sample motor control. The undulator source on beamline 13-1 provides the spatially and temporally coherent X-ray beam required for ptychographic imaging in the energy range 500 – 1200 eV. This energy range allows access to the oxygen chemistry and the valence states of 3d transition metals found in energy storage materials, making soft x-ray ptychography a particularly powerful tool to study the chemical states and structure of battery materials at relevant length scales. The implementation of ptychographic imaging can therefore provide a wealth of additional information on battery operation and failure. Here we describe the development of this ptychography capability, along with its application to the study of energy storage materials.

Paper Details

Date Published: 18 September 2015
PDF: 7 pages
Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920B (18 September 2015); doi: 10.1117/12.2188811
Show Author Affiliations
Anna M. Wise, SLAC National Accelerator Lab. (United States)
Hendrik Ohldag, SLAC National Accelerator Lab. (United States)
William Chueh, Stanford Univ. (United States)
SLAC National Accelerator Lab. (United States)
Joshua Turner, SLAC National Accelerator Lab. (United States)
Michael F. Toney, SLAC National Accelerator Lab. (United States)
Johanna Nelson Weker, SLAC National Accelerator Lab. (United States)


Published in SPIE Proceedings Vol. 9592:
X-Ray Nanoimaging: Instruments and Methods II
Barry Lai, Editor(s)

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