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Proceedings Paper

JWST pathfinder telescope risk reduction cryo test program
Author(s): Gary W. Matthews; Thomas R. Scorse; John A. Spina; Darin M. Noël; Keith A. Havey; Jesse A. Huguet; Tony L. Whitman; Conrad Wells; Chanda B. Walker; Sharon Lunt; James B. Hadaway; Ritva Keski-Kuha; Lee D. Feinberg; Mark F. Voyton; Juli A. Lander; James M. Marsh
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Paper Abstract

In 2014, the Optical Ground Support Equipment was integrated into the large cryo vacuum chamber at Johnson Space Center (JSC) and an initial Chamber Commissioning Test was completed. This insured that the support equipment was ready for the three Pathfinder telescope cryo tests. The Pathfinder telescope which consists of two primary mirror segment assemblies and the secondary mirror was delivered to JSC in February 2015 in support of this critical risk reduction test program prior to the flight hardware. This paper will detail the Chamber Commissioning and first optical test of the JWST Pathfinder telescope.

Paper Details

Date Published: 31 August 2015
PDF: 18 pages
Proc. SPIE 9575, Optical Manufacturing and Testing XI, 957505 (31 August 2015); doi: 10.1117/12.2188793
Show Author Affiliations
Gary W. Matthews, Harris Corp. (United States)
Thomas R. Scorse, Harris Corp. (United States)
John A. Spina, Harris Corp. (United States)
Darin M. Noël, Harris Corp. (United States)
Keith A. Havey, Harris Corp. (United States)
Jesse A. Huguet, Harris Corp. (United States)
Tony L. Whitman, Harris Corp. (United States)
Conrad Wells, Harris Corp. (United States)
Chanda B. Walker, Harris Corp. (United States)
Sharon Lunt, Harris Corp. (United States)
James B. Hadaway, The Univ. of Alabama in Huntsville (United States)
Ritva Keski-Kuha, NASA Goddard Space Flight Ctr. (United States)
Lee D. Feinberg, NASA Goddard Space Flight Ctr. (United States)
Mark F. Voyton, NASA Goddard Space Flight Ctr. (United States)
Juli A. Lander, NASA Goddard Space Flight Ctr. (United States)
James M. Marsh, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 9575:
Optical Manufacturing and Testing XI
Oliver W. Fähnle; Ray Williamson; Dae Wook Kim, Editor(s)

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