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Proceedings Paper

JWST pathfinder telescope integration
Author(s): Gary W. Matthews; Scott H. Kennard; Ronald T. Broccolo; James M. Ellis; Elizabeth A. Daly; Walter G. Hahn; John N. Amon; Stephen M. Mt. Pleasant; Scott Texter; Charles B. Atkinson; Andrew McKay; Joshua Levi; Ritva Keski-Kuha; Lee Feinberg
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Paper Abstract

The James Webb Space Telescope (JWST) is a 6.5m, segmented, IR telescope that will explore the first light of the universe after the big bang. In 2014, a major risk reduction effort related to the Alignment, Integration, and Test (AI and T) of the segmented telescope was completed. The Pathfinder telescope includes two Primary Mirror Segment Assemblies (PMSA’s) and the Secondary Mirror Assembly (SMA) onto a flight-like composite telescope backplane. This pathfinder allowed the JWST team to assess the alignment process and to better understand the various error sources that need to be accommodated in the flight build. The successful completion of the Pathfinder Telescope provides a final integration roadmap for the flight operations that will start in August 2015.

Paper Details

Date Published: 27 August 2015
PDF: 16 pages
Proc. SPIE 9575, Optical Manufacturing and Testing XI, 957504 (27 August 2015); doi: 10.1117/12.2188780
Show Author Affiliations
Gary W. Matthews, Harris Corp. (United States)
Scott H. Kennard, Harris Corp. (United States)
Ronald T. Broccolo, Harris Corp. (United States)
James M. Ellis, Harris Corp. (United States)
Elizabeth A. Daly, Harris Corp. (United States)
Walter G. Hahn, Harris Corp. (United States)
John N. Amon, Harris Corp. (United States)
Stephen M. Mt. Pleasant, Harris Corp. (United States)
Scott Texter, Northrop Grumman Aerospace Systems (United States)
Charles B. Atkinson, Northrop Grumman Aerospace Systems (United States)
Andrew McKay, Northrop Grumman Aerospace Systems (United States)
Joshua Levi, Northrop Grumman Aerospace Systems (United States)
Ritva Keski-Kuha, NASA Goddard Space Flight Ctr. (United States)
Lee Feinberg, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 9575:
Optical Manufacturing and Testing XI
Oliver W. Fähnle; Ray Williamson; Dae Wook Kim, Editor(s)

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