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Proceedings Paper

A polarization system for persistent chemical detection
Author(s): Julia Craven-Jones; Leah Appelhans; Eric Couphos; Todd Embree; Patrick Finnegan; Dennis Goldstein; David Karelitz; Charles LaCasse; Ting S. Luk; Adoum Mahamat; Lee Massey; Anthony Tanbakuchi; Cody Washburn; Steven Vigil
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Paper Abstract

We report on the development of a prototype polarization tag based system for detecting chemical vapors. The system primarily consists of two components, a chemically sensitive tag that experiences a change in its optical polarization properties when exposed to a specific chemical of interest, and an optical imaging polarimeter that is used to measure the polarization properties of the tags. Although the system concept could be extended to other chemicals, for the initial system prototype presented here the tags were developed to be sensitive to hydrogen fluoride (HF) vapors. HF is used in many industrial processes but is highly toxic and thus monitoring for its presence and concentration is often of interest for personnel and environmental safety. The tags are periodic multilayer structures that are produced using standard photolithographic processes. The polarimetric imager has been designed to measure the degree of linear polarization reflected from the tags in the short wave infrared. By monitoring the change in the reflected polarization signature from the tags, the polarimeter can be used to determine if the tag was exposed to HF gas. In this paper, a review of the system development effort and preliminary test results are presented and discussed, as well as our plan for future work.

Paper Details

Date Published: 1 September 2015
PDF: 13 pages
Proc. SPIE 9613, Polarization Science and Remote Sensing VII, 96130B (1 September 2015); doi: 10.1117/12.2188718
Show Author Affiliations
Julia Craven-Jones, Sandia National Labs. (United States)
Leah Appelhans, Sandia National Labs. (United States)
Eric Couphos, Sandia National Labs. (United States)
Todd Embree, Sandia National Labs. (United States)
Patrick Finnegan, Sandia National Labs. (United States)
Dennis Goldstein, Polaris Sensor Technologies, Inc. (United States)
David Karelitz, Sandia National Labs. (United States)
Charles LaCasse, Sandia National Labs. (United States)
Ting S. Luk, Sandia National Labs. (United States)
Adoum Mahamat, College of Optical Sciences, The Univ. of Arizona (United States)
Lee Massey, Sandia National Labs. (United States)
Anthony Tanbakuchi, Sandia National Labs. (United States)
Cody Washburn, Sandia National Labs. (United States)
Steven Vigil, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 9613:
Polarization Science and Remote Sensing VII
Joseph A. Shaw; Daniel A. LeMaster, Editor(s)

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