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Proceedings Paper

Improving profitability through slurry management: a look at the impact of slurry pH on various glass types
Author(s): Abigail R. Hooper; Christopher C. Boffa; Harry W. Sarkas; Kevin Cureton
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Paper Abstract

When building an optical system, optical fabricators and designers meticulously choose the glass types for their application knowing that each one will have different chemical, thermal and mechanical properties. As the requirements for new optical systems have grown more demanding, the range of available glass types has vastly expanded and the specifications on the produced products have grown tighter. In an attempt to simplify processes and streamline consumable purchases, optical polishing houses often rely on one polishing slurry to manage these vast array of glass types. An unforeseen consequence of these practices can be a reduction in productivity by reduced removal rate, poor yields and frequent rework all translating into higher costs and reduced profitability. In this paper, the authors will examine the impact slurry pH has on glass types of different compositions and chemical, thermal and mechanical properties when using a double-sided polishing process. Experiments will use material removal rate, surface quality, and surface figure to provide insight into improving process control for differing glass types. Further guidance will be provided on how simple on-site monitoring and adjustment can deliver improved profitability on challenging substrates.

Paper Details

Date Published: 27 August 2015
PDF: 9 pages
Proc. SPIE 9575, Optical Manufacturing and Testing XI, 95750M (27 August 2015); doi: 10.1117/12.2188693
Show Author Affiliations
Abigail R. Hooper, Nanophase Technologies Corp. (United States)
Christopher C. Boffa, Nanophase Technologies Corp. (United States)
Harry W. Sarkas, Nanophase Technologies Corp. (United States)
Kevin Cureton, Nanophase Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 9575:
Optical Manufacturing and Testing XI
Oliver W. Fähnle; Ray Williamson; Dae Wook Kim, Editor(s)

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