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Proceedings Paper

Development of polycapillary x-ray optics for synchrotron spectroscopy
Author(s): Mark A. Popecki; Daniel Bennis; Bernhard Adams; Aileen O'Mahony; Christopher A. Craven; Michael R. Foley; Michael J. Minot; Joseph M. Renaud; Justin L. Bond; Michael E. Stochaj; Klaus Attenkofer; Eli Stavitski
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Paper Abstract

A new spectrometer design that will result in a highly efficient, easy to handle, low-cost, high-resolution spectroscopy system with excellent background suppression is being developed for the NSLS-II Inner-Shell Spectroscopy beamline. This system utilizes non-diffractive optics comprised of fused and directed glass capillary tubes that will be used to collect and pre-collimate fluorescence photons. There are several advantages enabled by this design; a large energy range is accessible without modifying the s-stem, a large collection angle is achieved per detection unit: 4-5% of the full solid angle, easy integration in complex and harsh environments is enabled due to the use of a pre-collimation system as a secondary source for the spectrometer, and background from a complex sample environment can be easily and efficiently suppressed.

The polycapillary X-ray focusing optics segment of this application has been under development. This includes improvement in manufacturing methods of polycapillary structure for x-ray optics, forming the polycapillary structure to produce X-ray optics to achieve the required solid angle collection and transmission efficiency, and measurement of X-ray focusing properties of the optics using an X-ray source. Two promising advances are large open area ratios of 80% or more, and the possibility of adding coatings in the capillaries using Atomic Layer Deposition techniques to improve reflection efficiency.

Paper Details

Date Published: 26 August 2015
PDF: 7 pages
Proc. SPIE 9588, Advances in X-Ray/EUV Optics and Components X, 95880D (26 August 2015); doi: 10.1117/12.2188687
Show Author Affiliations
Mark A. Popecki, Incom, Inc. (United States)
Daniel Bennis, Incom, Inc. (United States)
Bernhard Adams, Incom, Inc. (United States)
Aileen O'Mahony, Incom, Inc. (United States)
Christopher A. Craven, Incom, Inc. (United States)
Michael R. Foley, Incom, Inc. (United States)
Michael J. Minot, Incom, Inc. (United States)
Joseph M. Renaud, Incom, Inc. (United States)
Justin L. Bond, Incom, Inc. (United States)
Michael E. Stochaj, Incom, Inc. (United States)
Klaus Attenkofer, Brookhaven National Lab. (United States)
Eli Stavitski, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 9588:
Advances in X-Ray/EUV Optics and Components X
Shunji Goto; Christian Morawe; Ali M. Khounsary, Editor(s)

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