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Proceedings Paper

Development of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules
Author(s): Thomas C. Felder; William J. Gambogi; James G. Kopchick; Lucas Amspacher; R. Scott Peacock; Benjamin Foltz; Katherine M. Stika; Alexander Z. Bradley; Babak Hamzavy; Bao-Ling Yu; Lucie Garreau-iles; Oakland Fu; Hongjie Hu; T. John Trout
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Paper Abstract

Matching accelerated test results to field observations is an important objective in the photovoltaic industry. We continue to develop test methods to strengthen correlations. We have previously reported good correlation of FTIR spectra between accelerated tests and field measurements. The availability of portable FTIR spectrometers has made measurement in the field convenient and reliable. Recently, nano-indentation has shown promise to correlate changes in backsheet mechanical properties. A precisely shaped stylus is pressed into a sample, load vs displacement recorded and mechanical properties of interest calculated in a nondestructive test. This test can be done on full size modules, allowing area variations in mechanical properties to be recorded. Finally, we will discuss optical profilometry. In this technique a white light interferogram of a surface is Fourier transformed to produce a three-dimensional image. Height differences from 1 nm to 5 mm can be detected over an area of a few cm. This technique can be used on minimodules, and is useful to determine crack and defect dimensions. Results will be presented correlating accelerated tests with fielded modules covering spectroscopic, mechanical, and morphological changes.

Paper Details

Date Published: 23 September 2015
PDF: 7 pages
Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 956303 (23 September 2015); doi: 10.1117/12.2188627
Show Author Affiliations
Thomas C. Felder, DuPont (United States)
William J. Gambogi, DuPont (United States)
James G. Kopchick, DuPont (United States)
Lucas Amspacher, DuPont (United States)
R. Scott Peacock, DuPont (United States)
Benjamin Foltz, DuPont (United States)
Katherine M. Stika, DuPont (United States)
Alexander Z. Bradley, DuPont (United States)
Babak Hamzavy, DuPont (United States)
Bao-Ling Yu, DuPont (United States)
Lucie Garreau-iles, DuPont International Operations Sarl (Switzerland)
Oakland Fu, DuPont (China) Research & Development and Management Co., Ltd. (China)
Hongjie Hu, DuPont (China) Research & Development and Management Co., Ltd. (China)
T. John Trout, DuPont (United States)

Published in SPIE Proceedings Vol. 9563:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII
Neelkanth G. Dhere; John H. Wohlgemuth; Rebecca Jones-Albertus, Editor(s)

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