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Proceedings Paper

BEaTriX, expanded x-ray beam facility for testing modular elements of telescope optics: an update
Author(s): C. Pelliciari; D. Spiga; E. Bonnini; E. Buffagni; C. Ferrari; G. Pareschi; G. Tagliaferri
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Paper Abstract

We present in this paper an update on the design of BEaTriX (Beam Expander Testing X-ray facility), an X-ray apparatus to be realized at INAF/OAB and that will generate an expanded, uniform and parallel beam of soft X-rays. BEaTriX will be used to perform the functional tests of X-ray focusing modules of large X-ray optics such as those for the ATHENA X-ray observatory, using the Silicon Pore Optics (SPO) as a baseline technology, and Slumped Glass Optics (SGO) as a possible alternative. Performing the tests in X-rays provides the advantage of an in-situ, at-wavelength quality control of the optical modules produced in series by the industry, performing a selection of the modules with the best angular resolution, and, in the case of SPOs, there is also the interesting possibility to align the parabolic and the hyperbolic stacks directly under X-rays, to minimize the aberrations. However, a parallel beam with divergence below 2 arcsec is necessary in order to measure mirror elements that are expected to reach an angular resolution of about 4 arcsec, since the ATHENA requirement for the entire telescope is 5 arcsec. Such a low divergence over the typical aperture of modular optics would require an X-ray source to be located in a several kilometers long vacuum tube. In contrast, BEaTriX will be compact enough (5 m x 14 m) to be housed in a small laboratory, will produce an expanded X-ray beam 60 mm x 200 mm broad, characterized by a very low divergence (1.5 arcsec HEW), strong polarization, high uniformity, and X-ray energy selectable between 1.5 keV and 4.5 keV. In this work we describe the BEaTriX layout and show a performance simulation for the X-ray energy of 4.5 keV.

Paper Details

Date Published: 21 September 2015
PDF: 12 pages
Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96031P (21 September 2015); doi: 10.1117/12.2188607
Show Author Affiliations
C. Pelliciari, INAF - Osservatorio Astronomico di Brera (Italy)
D. Spiga, INAF - Osservatorio Astronomico di Brera (Italy)
E. Bonnini, CNR-IMEM (Italy)
E. Buffagni, CNR-IMEM (Italy)
C. Ferrari, CNR-IMEM (Italy)
G. Pareschi, INAF - Osservatorio Astronomico di Brera (Italy)
G. Tagliaferri, INAF - Osservatorio Astronomico di Brera (Italy)


Published in SPIE Proceedings Vol. 9603:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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