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Proceedings Paper

Fabrication and characterization of a non-zero dispersion-shifted mechanically-induced long-period grating for optical fiber sensing
Author(s): E. Gallegos-Arellano; R. I. Mata Chávez; E. Huerta-Mascotte; J. M. Estudillo-Ayala; A. D. Guzmán-Chávez; E. Vargas-Rodriguez; J. M. Sierra-Hernández; R. Rojas-Laguna; I. Guryev
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Paper Abstract

We present the fabrication and characterization of a mechanically induced long period grating (MLPG) using a grating period of 400 μm and 1m of NZ-DSF. Pressure is gradually applied up to 120 Lb at different angles like 0, 30, 45 and 60 degrees. An attenuation band is observed centered at a wavelength around 1064nm using a fiber position of 30 degrees with respect to the grating´s metal plate and a maximum pressure of 145 Lb. The loss band presents a maximum depth of 22dB and a bandwidth of approximately 10nm. Torsion and curvature characterizations did not change the output spectrum of the optical grating. However, temperature characterization depicted a small shifting which could be insignificant for some applications. Still, there is 16dB attenuation as temperature increases in a range from room temperature up to 450°C. These preliminary studies show that this 1064 nm centered wavelength MILPG might be used in a low linear dynamic range with temperature (75-300)°C as a temperature sensor.

Paper Details

Date Published: 25 August 2015
PDF: 6 pages
Proc. SPIE 9581, Laser Beam Shaping XVI, 95810Q (25 August 2015); doi: 10.1117/12.2188554
Show Author Affiliations
E. Gallegos-Arellano, Univ. de Guanajuato (Mexico)
R. I. Mata Chávez, Univ. de Guanajuato (Mexico)
E. Huerta-Mascotte, Univ. de Guanajuato (Mexico)
J. M. Estudillo-Ayala, Univ. de Guanajuato (Mexico)
A. D. Guzmán-Chávez, Univ. de Guanajuato (Mexico)
E. Vargas-Rodriguez, Univ. de Guanajuato (Mexico)
J. M. Sierra-Hernández, Univ. de Guanajuato (Mexico)
R. Rojas-Laguna, Univ. de Guanajuato (Mexico)
I. Guryev, Univ. de Guanajuato (Mexico)

Published in SPIE Proceedings Vol. 9581:
Laser Beam Shaping XVI
Andrew Forbes; Todd E. Lizotte, Editor(s)

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