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Proceedings Paper

Modeling superposition of 3- and N-polarized beams on an isotropic photo detector
Author(s): Chandrasekhar Roychoudhuri; Michael Ambroselli
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Paper Abstract

In a previous paper [SPIE Proc.Vol.7063, paper #4 (2008)], we have attempted to model possible modes of excitations that detecting dipoles carry out during the interaction process with EM waves before absorbing a quantum cupful of energy out of the two simultaneously stimulating EM waves along with experimental validations. Those experiments and analyses basically corroborate the law of Malus. For these two-beam cases, the cosθ-factor, (θ being the angle between the two polarization vectors), is too symmetric and too simple a case to assure that we are modeling the energy absorption process definitively. Accordingly, this paper brings in asymmetry in the interaction process by considering 3-beam and N-beam cases to find out whether there are more subtleties behind the energy absorption processes when more than two beams are simultaneous stimulating a detector for the transfer of EM energy from these multiple beams. We have suggested a possible experimental set up for a three-polarized beam experiment that we plan to carry out in the near future. We also present analyses for 3-beam and simplified Nbeam cases and computed curves for some 3-beam cases. The results strengthen what we concluded in our two beam experimental paper. We also recognize that the mode of mathematical analyses, based upon traditional approach, may not be sufficient to extract any more details of the invisible light-dipole interaction processes going on in nature.

Paper Details

Date Published: 10 September 2015
PDF: 11 pages
Proc. SPIE 9570, The Nature of Light: What are Photons? VI, 95701A (10 September 2015); doi: 10.1117/12.2188518
Show Author Affiliations
Chandrasekhar Roychoudhuri, Univ. of Connecticut (United States)
Michael Ambroselli, Univ. of Connecticut (United States)

Published in SPIE Proceedings Vol. 9570:
The Nature of Light: What are Photons? VI
Chandrasekhar Roychoudhuri; Al F. Kracklauer; Hans De Raedt, Editor(s)

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