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Proceedings Paper

Smart CMOS sensor for wideband laser threat detection
Author(s): Craig R. Schwarze; Sameer Sonkusale
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Paper Abstract

The proliferation of lasers has led to their widespread use in applications ranging from short range standoff chemical detection to long range Lidar sensing and target designation operating across the UV to LWIR spectrum. Recent advances in high energy lasers have renewed the development of laser weapons systems. The ability to measure and assess laser source information is important to both identify a potential threat as well as determine safety and nominal hazard zone (NHZ). Laser detection sensors are required that provide high dynamic range, wide spectral coverage, pulsed and continuous wave detection, and large field of view. OPTRA, Inc. and Tufts have developed a custom ROIC smart pixel imaging sensor architecture and wavelength encoding optics for measurement of source wavelength, pulse length, pulse repetition frequency (PRF), irradiance, and angle of arrival. The smart architecture provides dual linear and logarithmic operating modes to provide 8+ orders of signal dynamic range and nanosecond pulse measurement capability that can be hybridized with the appropriate detector array to provide UV through LWIR laser sensing. Recent advances in sputtering techniques provide the capability for post-processing CMOS dies from the foundry and patterning PbS and PbSe photoconductors directly on the chip to create a single monolithic sensor array architecture for measuring sources operating from 0.26 – 5.0 microns, 1 mW/cm2 – 2 kW/cm2.

Paper Details

Date Published: 1 September 2015
PDF: 5 pages
Proc. SPIE 9611, Imaging Spectrometry XX, 96110S (1 September 2015); doi: 10.1117/12.2188490
Show Author Affiliations
Craig R. Schwarze, OPTRA, Inc. (United States)
Sameer Sonkusale, Tufts Univ. (United States)


Published in SPIE Proceedings Vol. 9611:
Imaging Spectrometry XX
Thomas S. Pagano; John F. Silny, Editor(s)

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