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Proceedings Paper

Three-dimensional speckle imaging employing a frequency-locked tunable diode laser
Author(s): Bret D. Cannon; Bruce E. Bernacki; John T. Schiffern; Albert Mendoza
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Paper Abstract

We describe a high accuracy frequency stepping method for a tunable diode laser to improve a three dimensional (3D) imaging approach based upon interferometric speckle imaging. The approach, modeled after Takeda, exploits tuning an illumination laser in frequency as speckle interferograms of the object (specklegrams) are acquired at each frequency in a Michelson interferometer. The resulting 3D hypercube of specklegrams encode spatial information in the x-y plane of each image with laser tuning arrayed along its z-axis. The specklegrams are processed by Fast Fourier Transformation (FFT) along the z-axis of the hypercube and the center of the peak in the resulting power spectrum for each pixel encodes its surface height. Alternatively, Takeda’s method can be followed which uses the phase of the FFT, unwraps it, and determines the surface height encoded in the slope of a line fitted to the phase. Wraparound of modulations above the Nyquist limit results in ambiguity in the optical path difference (OPD) between test and reference surfaces. Wraparound also amplifies measurement noise caused by errors and jitter in frequency stepping the illumination laser. By locking the laser frequency to successive cavity modes of a reference confocal interferometer, tuning is precisely controlled resulting in dramatically improved imaging quality/. We present laboratory data of before and after results showing enhanced 3D imaging resulting from precise laser frequency control.

Paper Details

Date Published: 1 September 2015
PDF: 9 pages
Proc. SPIE 9576, Applied Advanced Optical Metrology Solutions, 957604 (1 September 2015); doi: 10.1117/12.2188470
Show Author Affiliations
Bret D. Cannon, Pacific Northwest National Lab. (United States)
Bruce E. Bernacki, Pacific Northwest National Lab. (United States)
John T. Schiffern, Pacific Northwest National Lab. (United States)
Albert Mendoza, Pacific Northwest National Lab. (United States)


Published in SPIE Proceedings Vol. 9576:
Applied Advanced Optical Metrology Solutions
Erik Novak; James D. Trolinger, Editor(s)

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