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Proceedings Paper

The use of laterally graded multilayer mirrors for soft x-ray polarimetry
Author(s): Herman L. Marshall; Norbert S. Schulz; David L. Windt; Eric M. Gullikson; Marshall Craft; Eric Blake; Connor Ross
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Paper Abstract

We present continued development of laterally graded multilayer mirrors (LGMLs) for a telescope design capable of measuring linear X-ray polarization over a broad spectral band. The multilayer-coated mirrors are used as Bragg reflectors at the Brewster angle. By matching to the dispersion of a spectrometer, one may take advantage of high multilayer reflectivities and achieve modulation factors near 100%. In Phase II of the polarimetry beam- line development, we demonstrated that the system provides 100% polarized X-rays at 0.525 keV (Marshall et al. 2013). In Phase III of the polarimetry beam-line development, we installed an LGML in the source to polarize a wide range of energies between 0.15 and 0.70 keV (Marshall et al. 2014). Here, we present results from continued development of the LGMLs to improve reflectivity in the band of interest, a blazed reflection grating that is suitable for a small flight instrument, and a new detector with a directly deposited optical blocking filter. We also present updated plans for a suborbital rocket experiment designed to detect a polarization level of better than 10% for an active galactic nucleus.

Paper Details

Date Published: 10 September 2015
PDF: 8 pages
Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 960319 (10 September 2015); doi: 10.1117/12.2188452
Show Author Affiliations
Herman L. Marshall, MIT Kavli Institute for Astrophysics and Space Research (United States)
Norbert S. Schulz, MIT Kavli Institute for Astrophysics and Space Research (United States)
David L. Windt, Reflective X-Ray Optics LLC (United States)
Eric M. Gullikson, Lawrence Berkeley National Lab. (United States)
Marshall Craft, Massachusetts Institute of Technology (United States)
Eric Blake, Univ. of Massachusetts, Lowell (United States)
Connor Ross, Univ. of Massachusetts, Amherst (United States)


Published in SPIE Proceedings Vol. 9603:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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