Share Email Print

Proceedings Paper

Ptychographic nanotomography at the Swiss Light Source
Author(s): Manuel Guizar-Sicairos; Mirko Holler; Ana Diaz; Julio C. da Silva; Esther H. R. Tsai; Oliver Bunk; Carlos Martinez-Perez; Philip C. J. Donoghue; Charles H. Wellman; Andreas Menzel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Ptychography combines elements of scanning probe microscopy with coherent diffractive imaging and provides a robust high-resolution imaging technique. The extension of X-ray ptychography to 3D provides nanoscale maps with quantitative contrast of the sample complex-valued refractive index. We present here progress in reconstruction and post-processing algorithms for ptychographic nanotomography, as well as outline advances in the implementation and development of dedicated instrumentation for fast and precise 3D scanning at the Swiss Light Source. Compared to the first demonstration in 2010, such developments have allowed a dramatic improvement in resolution and measurement speed, with direct impact in the application of the technique for biology and materials science. We showcase the technique by detailing the measurement and reconstruction of a fossilized dispersed spore.

Paper Details

Date Published: 18 September 2015
PDF: 6 pages
Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920A (18 September 2015); doi: 10.1117/12.2188313
Show Author Affiliations
Manuel Guizar-Sicairos, Paul Scherrer Institut (Switzerland)
Mirko Holler, Paul Scherrer Institut (Switzerland)
Ana Diaz, Paul Scherrer Institut (Switzerland)
Julio C. da Silva, Paul Scherrer Institut (Switzerland)
Esther H. R. Tsai, Paul Scherrer Institut (Switzerland)
Oliver Bunk, Paul Scherrer Institut (Switzerland)
Carlos Martinez-Perez, Univ. of Bristol (United Kingdom)
Univ. de Valencia (Spain)
Philip C. J. Donoghue, Univ. of Bristol (United Kingdom)
Charles H. Wellman, Univ. of Sheffield (United Kingdom)
Andreas Menzel, Paul Scherrer Institut (Switzerland)

Published in SPIE Proceedings Vol. 9592:
X-Ray Nanoimaging: Instruments and Methods II
Barry Lai, Editor(s)

© SPIE. Terms of Use
Back to Top