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Proceedings Paper

Polarization-based complex index of refraction estimation with diffuse scattering consideration
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Paper Abstract

Optical polarimetry is an approach that shows promise for refractive index estimation from scattering off a target’s surface, which is task of pivotal importance for remote sensing and computer graphics applications. However, the estimation often relies on a microfacet polarimetric bidirectional reflectance distribution function (pBRDF) that is limited to specular targets involving single surface scattering. In this paper, we develop an analytic model for the degree of polarization (DOP) reflected from a rough surface that includes a multiplicative factor for the effect of diffuse scattering. Evaluation of the model indicates that diffuse scattering can significantly affect the DOP values, and the biased DOP values can further lead to inaccurate estimation of the surface refractive index.

Paper Details

Date Published: 1 September 2015
PDF: 10 pages
Proc. SPIE 9613, Polarization Science and Remote Sensing VII, 96130Y (1 September 2015); doi: 10.1117/12.2188281
Show Author Affiliations
Hanyu Zhan, New Mexico State Univ. (United States)
David G. Voelz, New Mexico State Univ. (United States)
Xifeng Xiao, New Mexico State Univ. (United States)
Sang-Yeon Cho, New Mexico State Univ. (United States)

Published in SPIE Proceedings Vol. 9613:
Polarization Science and Remote Sensing VII
Joseph A. Shaw; Daniel A. LeMaster, Editor(s)

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