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Proceedings Paper

Exciton dissociation at organic small molecule donor-acceptor interfaces (Presentation Recording)
Author(s): Steven W. Robey
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Paper Abstract

Exciton dissociation at organic semiconductor donor-acceptor (D-A) heterojunctions is critical for the performance of organic photovoltaic (OPV) structures. Interfacial charge separation and recombination processes control device efficiency. We have investigated these fundamental interfacial issues using time-resolved two-photon photoemission (TR-2PPE), coupled with the formation of well-controlled D-A structures by organic molecular beam epitaxy. The interfacial electronic and molecular structure of these model interfaces was well-characterized using scanning tunneling microscopy and ultraviolet photoemission. Exciton dissociation dynamics were investigated by using a sub-picosecond pump pulse to create Pc π→π* transitions, producing a population of singlet (S1) Pc excitons. The subsequent decay dynamics of this population was monitored via photoemission with a time-delayed UV pulse. For CuPcC60 interfaces, S1 exciton population decay in the interfacial CuPc layer was much faster than decay in the bulk due to interfacial charge separation. The rate constant for exciton dissociation was found to be ≈ 7 x 10 12 sec-1 (≈ 140 fs). Excitons that lose energy via intersystem crossing (ISC) to triplet levels dissociate approximately 500 to 1000 times slower. The dependence of exciton dissociation on separation was also studied. Exciton dissociation falls of rapidly with distance from the interface. Dissociation from the 2nd, and subsequent, layers of H2Pc is reduced by at least a factor of 10 from that in the interfacial layer. Finally, investigations of the relative efficiency for interfacial exciton dissociation by alternative acceptors based on perylene cores, (perylene tetracarboxylic dianhydride, or PTCDA) compared to fullerene-based acceptors such as C60 will also be discussed.

Paper Details

Date Published: 5 October 2015
PDF: 1 pages
Proc. SPIE 9549, Physical Chemistry of Interfaces and Nanomaterials XIV, 95490K (5 October 2015); doi: 10.1117/12.2188266
Show Author Affiliations
Steven W. Robey, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 9549:
Physical Chemistry of Interfaces and Nanomaterials XIV
Sophia C. Hayes; Eric R. Bittner, Editor(s)

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