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Proceedings Paper

EUV multilayer coatings for solar imaging and spectroscopy
Author(s): David L. Windt
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Paper Abstract

This paper describes recent progress in the development of new EUV multilayer coatings for solar physics. In particular, we present results obtained with Pd/B4C/Y, Al/Zr, and Al-Mg/SiC multilayers, designed for normal incidence operation in the 9 – 50 nm wavelength range. We describe the development of both periodic multilayer films designed for narrowband imaging, and non-periodic multilayers designed to have a broad-spectral response for spectroscopy. The higher EUV reflectance provided by these new coatings, relative to older-generation coatings such as Si/Mo, Mo/Y, and others, will facilitate the development of future solar physics instruments for both imaging and spectroscopy having higher spatial and spectral resolution, while supporting the exposure times and cadences necessary to capture the evolution of flares, jets, CMEs and other dynamic processes in the solar atmosphere.

Paper Details

Date Published: 21 September 2015
PDF: 12 pages
Proc. SPIE 9604, Solar Physics and Space Weather Instrumentation VI, 96040P (21 September 2015); doi: 10.1117/12.2188230
Show Author Affiliations
David L. Windt, Reflective X-Ray Optics LLC (United States)

Published in SPIE Proceedings Vol. 9604:
Solar Physics and Space Weather Instrumentation VI
Silvano Fineschi; Judy Fennelly, Editor(s)

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