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Proceedings Paper

Multilayer optics for monochromatic high-resolution x-ray imaging mircoscopes
Author(s): Ph. Troussel; A. Do; D. Gontier; D. Dennetiere; P. Høghøj; S. Hedacq
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Paper Abstract

Within the framework of its researches on Inertial Confinement Fusion (ICF), the “Commissariat à l’Énergie Atomique et aux Énergies Alternatives” (CEA) studies and designs advanced X-ray diagnostics in order to probe dense plasmas produced by Laser facilities. The final goal for those diagnostics is to be used during experiments on the Laser Megajoules french facility (LMJ) at Bordeaux.

We present two types of advanced monochromatic High Resolution X-ray Imaging microscopes (HRXI) who have high spatial resolution capability (3-6 μm) and high efficiency.

The first microscope so-called MERSSIX consists of two toroïdals mirrors mounted into a Wolter type geometry and working at grazing incidence. Non-periodic multilayer (depth graded) mirrors were developed with special coatings designed to provide broadband X-ray reflectance in the 1 - 22 keV energy range. Associated to this Wolter microscope a potential monochromatic third mirror coated with a multilayer stack can be used for monochromatic application in that range.

The second microscope is composed of a transmission gold Fresnel Phase Zone Plate (FPZP) and a narrow bandwidth multilayer mirror. We present an experimental study with X-ray plasma-source and a complete characterization of the X-ray optics on the synchrotron radiation facility BESSY II.

Potentialities (a few μspatial resolution monochromatic images) and complementarity of these two monochromatic HRXI are discussed. The design of the MLs for each microscope is detailed.

Paper Details

Date Published: 26 August 2015
PDF: 11 pages
Proc. SPIE 9588, Advances in X-Ray/EUV Optics and Components X, 958805 (26 August 2015); doi: 10.1117/12.2188185
Show Author Affiliations
Ph. Troussel, Commissariat à l'Énergie Atomique (France)
A. Do, Commissariat à l'Énergie Atomique (France)
D. Gontier, Commissariat à l'Énergie Atomique (France)
D. Dennetiere, Synchrotron SOLEIL (France)
P. Høghøj, Xenocs (France)
S. Hedacq, Xenocs (France)

Published in SPIE Proceedings Vol. 9588:
Advances in X-Ray/EUV Optics and Components X
Shunji Goto; Christian Morawe; Ali M. Khounsary, Editor(s)

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