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Proceedings Paper

Arrange an asymmetrical metal-dielectric multilayer as a low loss metamaterial
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Paper Abstract

A metal-dielectric (M-D) multilayer has been applied as a subwavelength structure to exhibit the negative index of refraction. Periodic MD multilayer or symmetrical five layered MDMDM multilayer has been arranged to exhibit an equivalent complex refractive index with negative real part. As the extinction coefficient is much smaller than the index of refraction, the wave vector and Poynting vector are in opposite directions. How to reduce the extinction coefficient and raise the transmittance becomes an issue. In this work, the metal films within the multilayer are not arranged with the same thickness as well as dielectric films. The thickness of each layer is tuned to increase the transmittance. The previous example of a five layered MDMDM as a negative index metamaterial at a wavelength of 363.8nm is adopted here to do the improvement of loss. The near field simulation is also adopted here to observe the backward wave propagation as a negative refraction phenomenon.

Paper Details

Date Published: 31 August 2015
PDF: 7 pages
Proc. SPIE 9558, Nanostructured Thin Films VIII, 955812 (31 August 2015); doi: 10.1117/12.2188172
Show Author Affiliations
Yi-Jun Jen, National Taipei Univ. of Technology (Taiwan)
Ci-Yao Jheng, National Taipei Univ. of Technology (Taiwan)
Kun-Han Lu, National Taipei Univ. of Technology (Taiwan)
Chien-Ying Chiang, National Taipei Univ. of Technology (Taiwan)


Published in SPIE Proceedings Vol. 9558:
Nanostructured Thin Films VIII
Akhlesh Lakhtakia; Tom G. Mackay; Motofumi Suzuki, Editor(s)

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