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Proceedings Paper

On the statistical error of the half energy width
Author(s): Giuseppe Vacanti
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Paper Abstract

The half energy width (HEW) is the all powerful performance parameter used to characterize and compare X-ray optics. Values of HEW are always reported without an error bar or confidence interval, suggesting that the statistical error associated with such estimates are negligible. Is this true? And if it is, could one characterize the optics more quickly accepting a non-negligible but still acceptable statistical error in the estimate of the HEW? We try to answer these questions with the use of non-parametric statistical methods and X-ray pencile beam data. .

Paper Details

Date Published: 21 September 2015
PDF: 3 pages
Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96030I (21 September 2015); doi: 10.1117/12.2188164
Show Author Affiliations
Giuseppe Vacanti, cosine Science & Computing B.V. (Netherlands)

Published in SPIE Proceedings Vol. 9603:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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