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Proceedings Paper

Experimental measurement and analysis of wavelength-dependent properties of the BRDF
Author(s): Samuel D. Butler; Stephen E. Nauyoks; Michael A. Marciniak
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Paper Abstract

The microfacet BRDF model is preferred to describe reflectance in many applications due to its closed-form approximation to the BRDF which is relatively easy to use; however, it almost entirely excludes wavelength-dependent scaling of the reflectance distribution. To rectify this, the BRDF was measured at multiple incident angles and for multiple materials at several wavelengths between 3.39 μm and 10.6 μm. Results quantify the dramatic change in the specular BRDF of a variety of materials even after accounting for overall reflectance, and suggests it is necessary to modify the wavelength dependence in the microfacet model.

Paper Details

Date Published: 1 September 2015
PDF: 15 pages
Proc. SPIE 9611, Imaging Spectrometry XX, 96110G (1 September 2015); doi: 10.1117/12.2188093
Show Author Affiliations
Samuel D. Butler, Air Force Institute of Technology (United States)
Stephen E. Nauyoks, Air Force Institute of Technology (United States)
Michael A. Marciniak, Air Force Institute of Technology (United States)

Published in SPIE Proceedings Vol. 9611:
Imaging Spectrometry XX
Thomas S. Pagano; John F. Silny, Editor(s)

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