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Proceedings Paper

Thin film PV standing tall side-by-side with multi-crystalline silicon: also in terms of reliability
Author(s): Neelkanth G. Dhere; Allan Ward; Robert Wieting; Subhendu Guha; Ramesh G. Dhere
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Paper Abstract

Triple junction hydrogenated amorphous silicon (a-Si:H) have shown exceptionally good reliability and durability. Cadmium telluride, CdTe PV modules have shown the lowest production cost without subsidies. Copper-indium gallium selenide sulfide (CIGS) and cadmium telluride (CdTe) cells and modules have been showing efficiencies equal or greater than those of multi-crystalline, (mx-Si), PV modules. Early generation CIGS and CdTe PV modules had a different qualification standard 61646 as compared to 61215 for crystalline silicon, (c-Si), PV modules. This, together with small vulnerability in harsh climates, was used to create doubts about their reliability. Recently CdTe and CIGS glass-to-glass modules have passed the rigorous accelerated tests, especially as long as the edge seals are not compromised. Moreover, the cumulative shipment of these modules is more than 12 GW demonstrating the customer confidence in these products. Hence it can be stated that also in terms of the reliability and durability all the thin film PV modules stand tall and compare favorably with mx-Si.

Paper Details

Date Published: 23 September 2015
PDF: 9 pages
Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 95630I (23 September 2015); doi: 10.1117/12.2187827
Show Author Affiliations
Neelkanth G. Dhere, Univ. of Central Florida (United States)
Allan Ward, First Solar (United States)
Robert Wieting, Stion Corp. (United States)
Subhendu Guha, ESGEE International (United States)
Ramesh G. Dhere, Episolar Inc. (United States)


Published in SPIE Proceedings Vol. 9563:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII
Neelkanth G. Dhere; John H. Wohlgemuth; Rebecca Jones-Albertus, Editor(s)

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