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Proceedings Paper

In-situ/operando soft x-ray spectroscopy characterization of interfacial phenomena in energy materials and devices
Author(s): Yi-Sheng Liu; Per-Anders Glans; Timothy S. Arthur; Fuminori Mizuno; Chinglin Chang; Way-Faung Pong; Jinghua Guo
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Paper Abstract

Many important energy systems are based on the complexity of material architecture, chemistry and interactions among constituents within. To understand and thus ultimately control the energy applications calls for in-situ/operando characterization tools. Recently, we have developed the in-situ/operando soft X-ray spectroscopic systems for the studies of catalytic and electrochemical reactions, and reveal how to overcome the challenge that soft X-rays cannot easily peek into the high-pressure catalytic or liquid electrochemical reactions. The unique design of in-situ/operando soft X-ray spectroscopy instrumentation and fabrication principle and one example are presented.

Paper Details

Date Published: 5 September 2015
PDF: 6 pages
Proc. SPIE 9560, Solar Hydrogen and Nanotechnology X, 956005 (5 September 2015); doi: 10.1117/12.2187742
Show Author Affiliations
Yi-Sheng Liu, Lawrence Berkeley National Lab. (United States)
Tamkang Univ. (Taiwan)
Per-Anders Glans, Lawrence Berkeley National Lab. (United States)
Timothy S. Arthur, Toyota Research Institute of North America (United States)
Fuminori Mizuno, Toyota Research Institute of North America (United States)
Chinglin Chang, Tamkang Univ. (Taiwan)
Way-Faung Pong, Tamkang Univ. (Taiwan)
Jinghua Guo, Lawrence Berkeley National Lab. (United States)
Univ. of California, Santa Cruz (United States)


Published in SPIE Proceedings Vol. 9560:
Solar Hydrogen and Nanotechnology X
Shaohua Shen, Editor(s)

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