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Proceedings Paper

Advancements in hard x-ray multilayers for x-ray astronomy
Author(s): David L. Windt
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Paper Abstract

This paper is focused on recent progress in the development of broad-band multilayer coatings designed for hard X-ray energies, for use in future astronomical telescopes. We describe a new laboratory-based hard X-ray reflectometer for atwavelength characterization of multilayer films, we present the results of an experimental comparison of the hard X-ray performance of several W-based periodic multilayer coatings, and we describe the optimization and experimental performance of new non-periodic Co-based multilayer coatings (both depth-graded and aperiodic), designed for continuous response through the W and Pt K-edges near 70 and 80 keV, respectively. We discuss future research directions in light of these new results.

Paper Details

Date Published: 4 September 2015
PDF: 14 pages
Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96031C (4 September 2015); doi: 10.1117/12.2187481
Show Author Affiliations
David L. Windt, Reflective X-Ray Optics LLC (United States)


Published in SPIE Proceedings Vol. 9603:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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