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Proceedings Paper

Influence of the thickness of a crystal on the electrical characteristics of Cd(Zn)Te detectors
Author(s): V. Sklyarchuk; P. Fochuk; I. Rarenko; Z. Zakharuk; O. F. Sklyarchuk; A. E. Bolotnikov; R. B. James
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Paper Abstract

We studied the electrical characteristics of Cd(Zn)Te detectors with rectifying contacts and varying thicknesses, and established that their geometrical dimensions affect the measured electrical properties. We found that the maximum value of the operating-bias voltage and the electric field in the detector for acceptable values of the dark current can be achieved when the crystal has an optimum thickness. This finding is due to the combined effect of generation-recombination in the space-charge region and space-charge limited currents (SCLC).

Paper Details

Date Published: 4 September 2015
PDF: 7 pages
Proc. SPIE 9593, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII, 959319 (4 September 2015); doi: 10.1117/12.2187478
Show Author Affiliations
V. Sklyarchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
P. Fochuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
I. Rarenko, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Z. Zakharuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
O. F. Sklyarchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
R. B. James, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 9593:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII
Larry Franks; Ralph B. James; Michael Fiederle; Arnold Burger, Editor(s)

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