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Proceedings Paper

Diffraction analysis of groove noise in optical disk readout signal
Author(s): Yoshinori Honguh
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Paper Abstract

The noise power spectrum was calculated for groove wall undulation based on the Fraunhofer diffraction theory. Groove profile fluctuations were modeled as fluctuations in the groove profile parameters. Changes in the diffracted light field were assumed to vary linearly with the changes in the groove profile. The expression for the noise power spectrum was obtained by statistical averaging, and the contribution of the undulation to the noise power spectrum was found to depend on the depth of the undulating area.

Paper Details

Date Published: 8 September 1995
PDF: 9 pages
Proc. SPIE 2514, Optical Data Storage '95, (8 September 1995); doi: 10.1117/12.218742
Show Author Affiliations
Yoshinori Honguh, Toshiba Corp. (Japan)


Published in SPIE Proceedings Vol. 2514:
Optical Data Storage '95
Gordon R. Knight; Hiroshi Ooki; Yuan-Sheng Tyan, Editor(s)

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