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Proceedings Paper

Optical frequency comb profilometry for large volume metrology
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Paper Abstract

An optical profilometer composed of an optical frequency comb source, a single pixel camera, and an optoelectronic interferometer in radio frequecny range have been developed toward large volume metrology. The optical profilometer allows us to measure an object with a large depth much more than a light wavelength without any 2π phase ambiguity. The wide dynamic range is achieved with high stability of the optical frequency comb and the simultaneous multi-singlefrequency operation. The single pixel camera is used for two-dimensional imaging without a mechanical scanning and the compressive sensing technique reduces the number of measurements. A surface profilometry for an object with a depth of several centimeters to a meter is demonstrated.

Paper Details

Date Published: 29 July 2015
PDF: 6 pages
Proc. SPIE 9659, International Conference on Photonics Solutions 2015, 965904 (29 July 2015); doi: 10.1117/12.2187287
Show Author Affiliations
Yoshio Hayasaki, Utsunomiya Univ. (Japan)
Quang Duc Pham, Utsunomiya Univ. (Japan)

Published in SPIE Proceedings Vol. 9659:
International Conference on Photonics Solutions 2015
Surasak Chiangga; Sarun Sumriddetchkajorn, Editor(s)

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