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Proceedings Paper

High-density phase-change optical disk with a Si reflective layer
Author(s): Mitsuya Okada; Shuichi Ohkubo; Tatsunori Ide; Michio Murahata; Hiroko Honda; Tsutomu Matsui
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Paper Abstract

For high-density recording at a wavelength of 690 nm, we developed a phase-change optical disk with a Si reflective layer. We estimated the effect of interference layer by calculating optical properties. The absorption control required for mark edge recording and a 2 dB C/N improvement was obtained by forming a ZnS-SiO2 interference layer on the Si layer. Under recording conditions with a minimum bit length of 0.335 micrometers and a track pitch of 1.2 micrometers , a sufficient C/N and a BER less than 10-4 were confirmed. This result indicates that the recording capacity of the new disk is more than 4 GB.

Paper Details

Date Published: 8 September 1995
PDF: 9 pages
Proc. SPIE 2514, Optical Data Storage '95, (8 September 1995); doi: 10.1117/12.218726
Show Author Affiliations
Mitsuya Okada, NEC Corp. (Japan)
Shuichi Ohkubo, NEC Corp. (Japan)
Tatsunori Ide, NEC Corp. (Japan)
Michio Murahata, NEC Corp. (Japan)
Hiroko Honda, NEC Corp. (Japan)
Tsutomu Matsui, NEC Corp. (Japan)


Published in SPIE Proceedings Vol. 2514:
Optical Data Storage '95
Gordon R. Knight; Hiroshi Ooki; Yuan-Sheng Tyan, Editor(s)

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