Share Email Print
cover

Proceedings Paper

Noise characteristics research of Overhauser magnetometer sensor
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Overhauser magnetometer, a kind of weak-magnetic measurement system based on the Overhauser effect, has been widely used in satellite magnetic survey, aeromagnetic survey and other engineering and environmental applications. Overhauser magnetometer plays an important role in the application of magnetic field measurement for its advantages of low power consumption and high accuracy. Weak field magnetic resonance is usually limited by the signal to noise ratio (SNR). In order to improve the SNR of Overhauser magnetometer, noise characteristics of Overhauser magnetometer sensor are investigated in this paper. A background noise model of Overhauser magnetometer sensor is presented. The calculated results indicate that the noise power spectral density shows a band-limited white noise characteristic. The maximum value of the noise power spectral density observed at the resonant frequency. The measured results coincide with the calculated results. The correlation between the SNR and the matched resistance is investigated by using the noise model. The calculated results demonstrate that large matched resistance is beneficial to improve the SNR of the sensor. When matched resistance is larger than 100kΩ, the SNR tends to be a constant. On the premise of stability, the sensor will achieve the optimal SNR when the matched resistance is around 100kΩ. This investigation is beneficial to improve noise performance of Overhauser magnetometer sensor.

Paper Details

Date Published: 8 September 2015
PDF: 9 pages
Proc. SPIE 9607, Earth Observing Systems XX, 960728 (8 September 2015); doi: 10.1117/12.2187213
Show Author Affiliations
Tala Liu, Jilin Univ. (China)
Lingjia Gu, Jilin Univ. (China)
Shuang Zhang, Jilin Univ. (China)
Haoyang Fu, Jilin Univ. (China)


Published in SPIE Proceedings Vol. 9607:
Earth Observing Systems XX
James J. Butler; Xiaoxiong (Jack) Xiong; Xingfa Gu, Editor(s)

© SPIE. Terms of Use
Back to Top