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Proceedings Paper

Application of imaging spectrometer in gas analysis by Raman scattering
Author(s): Duluo Zuo; Anlan Yu; Zhe Li; Xingbing Wang; Youhui Xiong
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Paper Abstract

Spontaneous Raman scattering is an effective technique in gas analysis, but the detection of minor constituents is difficult because of the low signal level and the usually existed background. Imaging spectrometer can provide highly spatial resolved spectra, so it should be much easier to pick up Raman signal of minor constituents from the Raman/fluorescence background of the sample cell and transporting optics compared with the widely used fiber-coupled spectrometers. For this reason, an imaging spectrometer was constructed from transmitting volume phase holographic grating, camera lenses and CCD detector. When it was used to analyze the gas sample in metal-lined capillary, which is a sample cell believed with great enhancement of Raman signal, the background was compressed obviously. When it was used to analyze the gas in a sample cell including a parabolic reflector, only weak background signal was observed, as the wide separation between the collecting zone (the focus point of the parabolic surface) and the wall of sample cell benefitted to the analysis by imaging spectrometer. By using the last sample cell, the signal from CO2 in ambient air was able to be found by an exposure time about 20 sec, and limits of detection for H2, CO2 and CO were estimated as 60 ppm, 100 ppm and 300 ppm respectively by the results of a longer exposure time. These results show that an imaging spectrometer paired with a well-arranged sample cell will lower the detecting limit effectively.

Paper Details

Date Published: 1 September 2015
PDF: 9 pages
Proc. SPIE 9611, Imaging Spectrometry XX, 96110N (1 September 2015); doi: 10.1117/12.2187188
Show Author Affiliations
Duluo Zuo, Huazhong Univ. of Science and Technology (China)
Anlan Yu, Huazhong Univ. of Science and Technology (China)
Zhe Li, Huazhong Univ. of Science and Technology (China)
Xingbing Wang, Huazhong Univ. of Science and Technology (China)
Youhui Xiong, Wuhan Cubic Optoelectronics Co., Ltd. (China)

Published in SPIE Proceedings Vol. 9611:
Imaging Spectrometry XX
Thomas S. Pagano; John F. Silny, Editor(s)

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