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Proceedings Paper

Evaluation and control of spatial frequency errors in reflective telescopes
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Paper Abstract

In this paper, the influence on the image quality of manufacturing residual errors was studied. By analyzing the statistical distribution characteristics of the residual errors and their effects on PSF and MTF, we divided those errors into low, middle and high frequency domains using the unit “cycles per aperture”. Two types of mid-frequency errors, algorithm intrinsic and tool path induced were analyzed. Control methods in current deterministic polishing process, such as MRF or IBF were presented.

Paper Details

Date Published: 27 August 2015
PDF: 8 pages
Proc. SPIE 9575, Optical Manufacturing and Testing XI, 95750C (27 August 2015); doi: 10.1117/12.2187170
Show Author Affiliations
Xuejun Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xuefeng Zeng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Haixiang Hu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Univ. of Chinese Academy of Sciences (China)
Ligong Zheng, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 9575:
Optical Manufacturing and Testing XI
Oliver W. Fähnle; Ray Williamson; Dae Wook Kim, Editor(s)

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