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Proceedings Paper

Dependence of contrast on probe/sample spacing with the magneto-optic Kerr effect scanning near-field magneto-optic microscope (MOKE-SNOM)
Author(s): Thomas J. Silva; A. B. Kos
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Paper Abstract

A magneto-optic Kerr effect scanning near-field optical microscope is used to image a stripe domain wall in a Co/Pt multilayer sample. The microscope is an improved version of a type previously reported, which uses light scattering from surface plasmons in 20 - 40 nm Ag particles as a near-field probe. Data is presented for both the probe intensity and polarization contrast as a function of probe/sample spacing. Oscillatory behavior in both sets of data is reasonably explained with a simplified model of optical interference.

Paper Details

Date Published: 6 September 1995
PDF: 7 pages
Proc. SPIE 2535, Near-Field Optics, (6 September 1995); doi: 10.1117/12.218702
Show Author Affiliations
Thomas J. Silva, National Institute of Standards and Technology (United States)
A. B. Kos, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 2535:
Near-Field Optics
Michael A. Paesler; Patrick J. Moyer, Editor(s)

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