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Proceedings Paper

Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope
Author(s): E. G. Borgonjen; Marco H. P. Moers; A. G. T. Ruiter; Niko F. van Hulst
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Paper Abstract

A `stand-alone' Photon Scanning Tunneling Microscope combined with an Atomic force Microscope, using a micro-fabricated silicon-nitride probe, is applied to the imaging of field distribution in integrated optical ridge waveguides. The electric field on the waveguide is locally probed by coupling to the evanescent wave. Application to direct observation of TM and TE modal field distributions, both in lateral and vertical direction, mode beating between low and higher order modes, and behavior of a Y-junction wavelength (de)multiplexer is demonstrated.

Paper Details

Date Published: 6 September 1995
PDF: 7 pages
Proc. SPIE 2535, Near-Field Optics, (6 September 1995); doi: 10.1117/12.218697
Show Author Affiliations
E. G. Borgonjen, Univ. Twente (Netherlands)
Marco H. P. Moers, Univ. Twente (Netherlands)
A. G. T. Ruiter, Univ. Twente (Netherlands)
Niko F. van Hulst, Univ. Twente (Netherlands)

Published in SPIE Proceedings Vol. 2535:
Near-Field Optics
Michael A. Paesler; Patrick J. Moyer, Editor(s)

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