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Proceedings Paper

Tunnel near-field optical microscopy (TNOM-2)
Author(s): Bert Hecht; Dieter W. Pohl; Harry Heinzelmann; Lukas Novotny
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Paper Abstract

Light emitted from the aperture of a near-field optical probe in the close vicinity of a dielectric object propagates in classically `forbidden' as well as `allowed' directions; the two zones are separated by the critical angle for total internal reflection. The new `tunnel' near-field optical microscopy (TNOM) technique makes use of forbidden and allowed radiation, in contrast to standard scanning near-field optical microscopy (SNOM or NSOM), which records only the allowed light. Scan images obtained with allowed and forbidden light are complementary to some extent; the latter, however, provide high contrast and resolution even in situations in which standard SNOM/NSOM shows little or no contrast. The influence of topography on image formation is analyzed and discussed.

Paper Details

Date Published: 6 September 1995
PDF: 8 pages
Proc. SPIE 2535, Near-Field Optics, (6 September 1995); doi: 10.1117/12.218689
Show Author Affiliations
Bert Hecht, IBM Research Div. (Switzerland)
Dieter W. Pohl, IBM Research Div. (Switzerland)
Harry Heinzelmann, Univ. of Basel (Switzerland)
Lukas Novotny, Swiss Federal Institute of Technology (Switzerland)


Published in SPIE Proceedings Vol. 2535:
Near-Field Optics
Michael A. Paesler; Patrick J. Moyer, Editor(s)

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