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Proceedings Paper

Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate
Author(s): Omar Vázquez-Estrada; Gesuri Morales-Luna; Alipio Calles-Martínez; Alejandro Reyes-Coronado; Augusto García-Valenzuela
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Paper Abstract

In this work we study the sensitivity and detection limits of optical reflectivity measurements to inspect the deposition of metallic nanoparticles on a at surface. We use a theoretical model for the coherent reflectance of a disordered monolayer of particles to calculate the reflectivity of an air-glass interface with silver and gold nanoparticles deposited randomly on it as a function of the angle of incidence and wavelength of light. Assuming reasonable noise scenarios, we estimate the minimum detectable surface coverage fractions by the nanoparticles.

Paper Details

Date Published: 20 August 2015
PDF: 9 pages
Proc. SPIE 9556, Nanoengineering: Fabrication, Properties, Optics, and Devices XII, 95561H (20 August 2015); doi: 10.1117/12.2186863
Show Author Affiliations
Omar Vázquez-Estrada, Univ. Nacional Autónoma de México (Mexico)
Gesuri Morales-Luna, Univ. Nacional Autónoma de México (Mexico)
Alipio Calles-Martínez, Univ. Nacional Autónoma de México (Mexico)
Alejandro Reyes-Coronado, Univ. Nacional Autónoma de México (Mexico)
Augusto García-Valenzuela, Univ. Nacional Autónoma de México (Mexico)


Published in SPIE Proceedings Vol. 9556:
Nanoengineering: Fabrication, Properties, Optics, and Devices XII
Eva M. Campo; Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)

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