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Proceedings Paper

Performance limiting processes in room temperature thallium bromide radiation detectors
Author(s): Amlan Datta; Piotr Becla; Demi Moed; Shariar Motakef
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Paper Abstract

Thallium Bromide (TlBr) is a promising room-temperature radiation detector candidate with excellent charge transport properties. However, several critical issues are needed to be addressed before deployment of this material for long-term field applications. In this paper, the relevance and, scientific and technological progress made towards solving these challenges for TlBr have been discussed. The possible research pathways to mitigate the concerns related to this material have been analyzed and clearly established. Findings from novel experiments performed at CapeSym have revealed that the most significant factors for achieving long-term performance stability for TlBr devices involve physical and chemical conditions of the surface, residual stress, and choice of metal contacts. Palladium electrodes on TlBr devices resulted in a 20-fold improvement in the device lifetime when compared to its Br-etched Pt counterpart. Electron and hole contributions towards the spectroscopic response of the TlBr detector significantly depend on the interaction position of the incoming radiation and was clearly observed in this study. TlBr device fabrication techniques need significant improvement in order to attain reliable, repeatable, and stable, long-term performance.

Paper Details

Date Published: 26 August 2015
PDF: 11 pages
Proc. SPIE 9593, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII, 95930E (26 August 2015); doi: 10.1117/12.2186861
Show Author Affiliations
Amlan Datta, CapeSym, Inc. (United States)
Piotr Becla, CapeSym, Inc. (United States)
Massachusetts Institute of Technology (United States)
Demi Moed, CapeSym, Inc. (United States)
Shariar Motakef, CapeSym, Inc. (United States)


Published in SPIE Proceedings Vol. 9593:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVII
Larry Franks; Ralph B. James; Michael Fiederle; Arnold Burger, Editor(s)

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