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Proceedings Paper

Resolution and degrees of freedom in near-field scanning microscopy
Author(s): Guiying Wang; Zhihua Ding; Zhifeng Fan; ZhiJiang Wang
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Paper Abstract

An expression of evanescent field of the scanning near-field optical microscope (SNOM) and a few effects on the resolving power are given. The concept about degrees of freedom of light information transmitted and resolution of SNOM are reviewed.

Paper Details

Date Published: 6 September 1995
PDF: 4 pages
Proc. SPIE 2535, Near-Field Optics, (6 September 1995); doi: 10.1117/12.218684
Show Author Affiliations
Guiying Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Zhihua Ding, Shanghai Institute of Optics and Fine Mechanics (China)
Zhifeng Fan, Shanghai Institute of Optics and Fine Mechanics (China)
ZhiJiang Wang, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 2535:
Near-Field Optics
Michael A. Paesler; Patrick J. Moyer, Editor(s)

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