Share Email Print

Proceedings Paper

Optical diffraction interpretation: an alternative to interferometers
Author(s): S. Bouillet; F. Audo; S. Fréville; L. Eupherte; C. Rouyer; J. Daurios
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Laser MégaJoule (LMJ) is a French high power laser project that requires thousands of large optical components. The wavefront performances of all those optics are critical to achieve the desired focal spot shape and to limit the hot spots that could damage the components. Fizeau interferometers and interferometric microscopes are the most commonly used tools to cover the whole range of interesting spatial frequencies. Anyway, in some particular cases like diffractive and/or coated and/or aspheric optics, an interferometric set-up becomes very expensive with the need to build a costly reference component or a specific to-the-wavelength designed interferometer. Despite the increasing spatial resolution of Fizeau interferometers, it may even not be enough, if you are trying to access the highest spatial frequencies of a transmitted wavefront for instance. The method we developed is based upon laser beam diffraction intermediate field measurements and their interpretation with a Fourier analysis and the Talbot effect theory. We demonstrated in previous papers that it is a credible alternative to classical methods. In this paper we go further by analyzing main error sources and discussing main practical difficulties.

Paper Details

Date Published: 27 August 2015
PDF: 9 pages
Proc. SPIE 9575, Optical Manufacturing and Testing XI, 95751A (27 August 2015); doi: 10.1117/12.2186793
Show Author Affiliations
S. Bouillet, Ctr. d'Etudes Scientifiques et Techniques d'Aquitane (France)
F. Audo, Ctr. d'Etudes Scientifiques et Techniques d'Aquitane (France)
S. Fréville, Ctr. d'Etudes Scientifiques et Techniques d'Aquitane (France)
L. Eupherte, Ctr. d'Etudes Scientifiques et Techniques d'Aquitane (France)
C. Rouyer, Ctr. d'Etudes Scientifiques et Techniques d'Aquitane (France)
J. Daurios, Ctr. d'Etudes Scientifiques et Techniques d'Aquitane (France)

Published in SPIE Proceedings Vol. 9575:
Optical Manufacturing and Testing XI
Oliver W. Fähnle; Ray Williamson; Dae Wook Kim, Editor(s)

© SPIE. Terms of Use
Back to Top