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Proceedings Paper

Analysis of aluminum nano-gratings assisted light reflection reduction in GaAs metal-semiconductor-metal photodetectors
Author(s): Zhenzhu Fan; Yahui Su; Huayong Zhang; Xiaohu Han; Feifei Ren
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Paper Abstract

Plasmonics-based GaAs metal-semiconductor-metal photodetector (MSM-PD) with aluminum nano-gratings was proposed. A detailed numerical study of subwavelength nanogratings behavior to reduce the light reflection is performed by finite-difference time domain (FDTD) algorithm. The geometric parameters of nano-gratings, such as aperture width, the nano-gratings height, the duty cycles are optimized for subwavelength metal nanogratings on GaAs substrate and their impact on light reflection below the conventional MSM-PD is confirmed. Simulation results show that a light reflection factor around 15% can be obtained near the wavelength of 900 nm with optimized MSM-PDs, and in visible light spectrum, the Al nano-gratings show better performance than Au nano-gratings.

Paper Details

Date Published: 23 September 2015
PDF: 7 pages
Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 95630T (23 September 2015); doi: 10.1117/12.2186654
Show Author Affiliations
Zhenzhu Fan, Anhui Univ. (China)
Yahui Su, Anhui Univ. (China)
Huayong Zhang, Anhui Univ. (China)
Xiaohu Han, Anhui Univ. (China)
Feifei Ren, Anhui Univ. (China)

Published in SPIE Proceedings Vol. 9563:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII
Neelkanth G. Dhere; John H. Wohlgemuth; Rebecca Jones-Albertus, Editor(s)

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