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Proceedings Paper

Polarization sensitivity testing of off-plane reflection gratings
Author(s): Hannah Marlowe; Randal L. McEntaffer; Casey T. DeRoo; Drew M. Miles; James H. Tutt; Christian Laubis; Victor Soltwisch
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Paper Abstract

Off-Plane reflection gratings were previously predicted to have different efficiencies when the incident light is polarized in the transverse-magnetic (TM) versus transverse-electric (TE) orientations with respect to the grating grooves. However, more recent theoretical calculations which rigorously account for finitely conducting, rather than perfectly conducting, grating materials no longer predict significant polarization sensitivity. We present the first empirical results for radially ruled, laminar groove profile gratings in the off-plane mount which demonstrate no difference in TM versus TE efficiency across our entire 300-1500 eV bandpass. These measurements together with the recent theoretical results confirm that grazing incidence off-plane reflection gratings using real, not perfectly conducting, materials are not polarization sensitive.

Paper Details

Date Published: 4 September 2015
PDF: 7 pages
Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 960318 (4 September 2015); doi: 10.1117/12.2186344
Show Author Affiliations
Hannah Marlowe, The Univ. of Iowa (United States)
Randal L. McEntaffer, The Univ. of Iowa (United States)
Casey T. DeRoo, The Univ. of Iowa (United States)
Drew M. Miles, The Univ. of Iowa (United States)
James H. Tutt, The Univ. of Iowa (United States)
Christian Laubis, Physikalisch-Technische Bundesanstalt (Germany)
Victor Soltwisch, Physikalisch-Technische Bundesanstalt (Germany)

Published in SPIE Proceedings Vol. 9603:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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