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Proceedings Paper

Calibrating the axes of the swing arm profilometer by the four-based laser trackers
Author(s): Mingxing Gao; Hongwei Jing; Tianquan Fan; Lin Chen; Jie Li
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Paper Abstract

The swing arm profilometer realizes the measurement of the different surface shape by adjusting the axis of the arm bearing and the axis of the workpiece bearing for different spatial positional relationships,so the high precision positional relationship between the axis of the arm bearing and the axis of the workpiece bearing is the premise to obtain accurate result. This paper presents a way using four-based laser trackers to calibrate the axes of the swing arm profilometer,that satisfies the requirement of the high precision and the dynamic calibration. The four-based laser trackers system only uses the precise distances to obtain the coordinates of points. The coordinates of points in the rotate arc of the axes can fit the axes,and the relationship between the axes can be know. The study of the self-calibration of the four-based laser trackers, the arrangement of four-based laser trackers, the design of the calibration method and the processing of measurement data are included in this paper. Finally, the study is validated by the preliminary experiment.

Paper Details

Date Published: 7 August 2015
PDF: 8 pages
Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230M (7 August 2015); doi: 10.1117/12.2186278
Show Author Affiliations
Mingxing Gao, The Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Hongwei Jing, The Institute of Optics and Electronics (China)
Tianquan Fan, The Institute of Optics and Electronics (China)
Lin Chen, The Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Jie Li, The Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 9623:
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Sen Han, Editor(s)

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