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Proceedings Paper

Challenges and needs for automating nano image processing for material characterization
Author(s): Yu Ding; Satish T. S. Bukkapatnam
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Paper Abstract

Image processing techniques are needed to extract critical information pertinent to nano material characterization but the current processing methods are slow, expensive and labor intensive. There is a strong need to develop fast and reliable methods, enabling process control compatible automated processing of nano images. The authors believe specialized techniques are needed to address the challenges, and will discuss the recent development of nano image processing methods as well as the near- and medium-terms needs in the area of nano metrology and imaging. The authors will share their broad perspectives on this research direction.

Paper Details

Date Published: 20 August 2015
PDF: 7 pages
Proc. SPIE 9556, Nanoengineering: Fabrication, Properties, Optics, and Devices XII, 95560Z (20 August 2015); doi: 10.1117/12.2186251
Show Author Affiliations
Yu Ding, Texas A&M Univ. (United States)
Satish T. S. Bukkapatnam, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 9556:
Nanoengineering: Fabrication, Properties, Optics, and Devices XII
Eva M. Campo; Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)

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