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Proceedings Paper

Laser-induced structural modification in bulk of single-crystal sapphire
Author(s): Z. U. Rehman; K. Kyeong; W. G. Jung; N. T. Le; K. A. Tran; V. H. Nguyen; B. J. Kim; K. A. Janulewicz
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Paper Abstract

We present characterization of structural modification triggered by tightly focused single pulses of a nanosecond laser inside single-crystal sapphire. Structural changes induced in the shock compressed region were investigated using high resolution transmission electron microscopy (HRTEM). Analysis of the zone around cavity in the bulk of sapphire reveals loss of crystalline order and formation of a mixture of amorphous/poly-crystalline structure. The properties of the laser-affected solid and possible routes of material transformation to the final state long after the pulse end is discussed. The results suggest that transformations to amorphous/poly-crystalline state occur as a result of sufficient heating of the shell region. This creates a localized molten zone which solidifies so rapidly that crystallization is by-passed.

Paper Details

Date Published: 14 July 2015
PDF: 7 pages
Proc. SPIE 9532, Pacific Rim Laser Damage 2015: Optical Materials for High-Power Lasers, 953215 (14 July 2015); doi: 10.1117/12.2185784
Show Author Affiliations
Z. U. Rehman, Gwangju Institute of Science and Technology (Korea, Republic of)
K. Kyeong, Gwangju Institute of Science and Technology (Korea, Republic of)
W. G. Jung, Gwangju Institute of Science and Technology (Korea, Republic of)
N. T. Le, Gwangju Institute of Science and Technology (Korea, Republic of)
K. A. Tran, Gwangju Institute of Science and Technology (Korea, Republic of)
V. H. Nguyen, Gwangju Institute of Science and Technology (Korea, Republic of)
B. J. Kim, Gwangju Institute of Science and Technology (Korea, Republic of)
K. A. Janulewicz, Gwangju Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 9532:
Pacific Rim Laser Damage 2015: Optical Materials for High-Power Lasers
Jianda Shao; Takahisa Jitsuno; Wolfgang Rudolph; Meiping Zhu, Editor(s)

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