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Proceedings Paper

Detection of cat-eye effect echo based on unit APD
Author(s): Dong-Sheng Wu; Bing-Qi Liu; Wen-Gang Hu; Yu Zhang
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Paper Abstract

The cat-eye effect echo of optical system can be detected based on CCD, but the detection range is limited within several kilometers. In order to achieve long-range even ultra-long-range detection, it ought to select APD as detector because of the high sensitivity of APD. The detection system of cat-eye effect echo based on unit APD is designed in paper. The implementation scheme and key technology of the detection system is presented. The detection performances of the detection system including detection range, detection probability and false alarm probability are modeled. Based on the model, the performances of the detection system are analyzed using typical parameters. The results of numerical calculation show that the echo signal-to-noise ratio is greater than six, the detection probability is greater than 99.9% and the false alarm probability is less tan 0.1% within 20 km detection range. In order to verify the detection effect, we built the experimental platform of detection system according to the design scheme and carry out the field experiments. The experimental results agree well with the results of numerical calculation, which prove that the detection system based on the unit APD is feasible to realize remote detection for cat-eye effect echo.

Paper Details

Date Published:
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Proc. SPIE 9618, 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 96181B; doi: 10.1117/12.2185776
Show Author Affiliations
Dong-Sheng Wu, Mechanical Engineering College (China)
Bing-Qi Liu, Mechanical Engineering College (China)
Wen-Gang Hu, Mechanical Engineering College (China)
Yu Zhang, Mechanical Engineering College (China)


Published in SPIE Proceedings Vol. 9618:
2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Xiaodi Tan; Kimio Tatsuno, Editor(s)

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