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Proceedings Paper

A carrier removal approach for fringe projection profilometry using principal component analysis
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Paper Abstract

We present a carrier removal method for Fourier transform profilometry using the principal component analysis. The proposed approach is able to decompose the phase map into several principal components, in which the phase of the carrier can be extracted from the first dominant component acquired. It can cope well with the nonlinear carrier problem resulted from the divergent illumination which is commonly adopted in the fringe projection profilometry. It is effective, fully automatic and does not require the estimation for system geometrical parameters or the prior knowledge on the measured object. Further, the influence of the lens distortion is considered thus the carrier can be determined more accurately. The principle of the technique is verified by our experiments.

Paper Details

Date Published: 17 July 2015
PDF: 6 pages
Proc. SPIE 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015), 952409 (17 July 2015); doi: 10.1117/12.2185663
Show Author Affiliations
Shijie Feng, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)
Chao Zuo, Nanjing Univ. of Science and Technology (China)
Jiasong Sun, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9524:
International Conference on Optical and Photonic Engineering (icOPEN 2015)
Anand K. Asundi; Yu Fu, Editor(s)

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