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Proceedings Paper

Sensing properties of periodic stack of nano-films deposited with various vapor-based techniques on optical fiber end-face
Author(s): Marcin Koba; Radosław Różycki-Bakon; Piotr Firek; Mateusz Śmietana
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Paper Abstract

This work presents a study on sensing capabilities of stacks of nano-films deposited on a single-mode optical fiber end-faces. The stacks consist of periodically interchanging thin-film layers of materials characterized by different refractive indices (RI). The number of layers is relatively small to encourage light-analyte interactions. Two different deposition techniques are considered, i.e., radio frequency plasma enhanced chemical vapor deposition (RF PECVD) and physical vapor deposition by reactive magnetron sputtering (RMS). The former technique allows to deposit stacks consisting of silicon nitride nano-films, and the latter is well suited for aluminum and titanium oxides alternating layers. The structures are tested for external RI and temperature measurements.

Paper Details

Date Published: 1 July 2015
PDF: 4 pages
Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 96550R (1 July 2015); doi: 10.1117/12.2185153
Show Author Affiliations
Marcin Koba, Warsaw Univ. of Technology (Poland)
National Institute of Telecommunications (Poland)
Radosław Różycki-Bakon, Warsaw Univ. of Technology (Poland)
Piotr Firek, Warsaw Univ. of Technology (Poland)
Mateusz Śmietana, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 9655:
Fifth Asia-Pacific Optical Sensors Conference
Byoungho Lee; Sang-Bae Lee; Yunjiang Rao, Editor(s)

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