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Proceedings Paper

Potential use of the characteristic Raman lines of toluene (C7H8 ) as a reference on the spectral analysis of fuel blends
Author(s): Valentin Ortega Clavero; Andreas Weber; Werner Schröder; Dan Curticapean
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Paper Abstract

We report the use of the Raman spectral information of the chemical compound toluene C7H8 as a reference on the analysis of laboratory-prepared and commercially acquired gasoline-ethanol blends. The rate behavior of the characteristic Raman lines of toluene and gasoline has enabled the approximated quantification of this additive in commercial gasoline-ethanol mixtures. This rate behavior has been obtained from the Raman spectra of gasoline-ethanol blends with different proportions of toluene.

All these Raman spectra have been collected by using a self-designed, frequency precise and low-cost Fourier-transform Raman spectrometer (FT-Raman spectrometer) prototype. This FT-Raman prototype has helped to accurately confirm the frequency position of the main characteristic Raman lines of toluene present on the different gasoline-ethanol samples analyzed at smaller proportions than those commonly found in commercial gasoline-ethanol blends. The frequency accuracy validation has been performed by analyzing the same set of toluene samples with two additional state-of-the-art commercial FT-Raman devices. Additionally, the spectral information has been contrasted, with highly-correlated coefficients as a result, with the values of the standard Raman spectrum of toluene.

Paper Details

Date Published: 22 June 2015
PDF: 7 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95254G (22 June 2015); doi: 10.1117/12.2185100
Show Author Affiliations
Valentin Ortega Clavero, Offenburg Univ. of Applied Sciences (Germany)
Andreas Weber, Offenburg Univ. of Applied Sciences (Germany)
Werner Schröder, Offenburg Univ. of Applied Sciences (Germany)
Dan Curticapean, Offenburg Univ. of Applied Sciences (Germany)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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