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Proceedings Paper

Polarized single-mode condition for SOI rib waveguide with large cross section
Author(s): Dengpeng Yuan; Ying Dong; Yujin Liu; Tianjian Li; Xudong Zhang; Yushan Tan
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Paper Abstract

In this paper the single mode condition of silicon-on-insulator (SOI) rib waveguide with large cross section is investigated based on the effective index method (EIM) by using numerical computation and analytical derivation with the consideration of the polarization effects. A polarized single-mode condition for SOI rib waveguide with large cross section is presented, the results from analytical derivation are highly concordant with that from numerical computation. For the vertical single-mode condition, the deviations between HE and EH modes correlate oppositely with the total rib height of rib waveguide, and the critical rib height ratio gradually approaches but never equals to 0.5 with the increase of the total rib height. There, HE mode and EH mode are commonly known as quasi-transverse-electric (TE) mode and quasi-transverse-magnetic (TM) mode respectively. The deviation of the critical rib width between HE and EH modes for the lateral single-mode condition is relatively small, which is a function of the rib height ratio but irrelevant to the total rib height for the specified index profile. The fact that the total rib height, index profile, and polarization of modes have effects on the single-mode condition of SOI rib waveguide with large cross section was demonstrated in this work, which was not discussed in the previous works. The results in this work can give guidance to design, simulation and fabrication of SOI rib waveguide with large cross section in practical applications.

Paper Details

Date Published: 12 August 2015
PDF: 12 pages
Proc. SPIE 9624, 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication, 96240A (12 August 2015); doi: 10.1117/12.2185098
Show Author Affiliations
Dengpeng Yuan, Tsinghua Univ. (China)
Ying Dong, Tsinghua Univ. (China)
Yujin Liu, Tsinghua Univ. (China)
Tianjian Li, Tsinghua Univ. (China)
Xudong Zhang, Tsinghua Univ. (China)
Yushan Tan, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 9624:
2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication
Zhiping Zhou; Changhe Zhou; Pavel Cheben, Editor(s)

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